ASSOCIATE EDITORS
A. M. Agogino
Mechanical Engineering Dept., University of
California, Berkeley, CA 94720, USA
M. S. Fox
Computer Science and Management Science,
University
of Toronto, 4 Taddle Creek, Roseburgh Bldg.Toronto,
Ontario, M5S 1A4 Canada
K. Ishii
Department of Mechanical Engineering, Design
Division, Stanford University, Stanford, CA 94305, USA
S. Fukuda
Tokyo Metropolitan Institute of Technology, 6-6,
Department of Production, Information and Systems
Engineering, 6-6, Asahigaoka, Hino, Tokyo, 191-0065,
Japan
BOOK REVIEW EDITOR
S. N. Dwivedi
University of Southwestern Louisiana, Dept. of
Mechanical Engineering, Lafayette, LA 70504-2251
ADVISORY BOARD
H. Adeli, Ohio State Univ., Ohio, USA
J. S. Gero, The University of Sydney, Australia
E. J. Haug, The University of Iowa, USA
M. E. Merchant, Inst. of Adv. Manuf. Sciences, USA
F. Mistree, Georgia Institute of Technology, USA
L. Nemes, CSIRO/Div. of Manuf. Tech., Australia
F. B. Prinz, Stanford University, USA
M. B. Zaremba, Univ. De Quebec A Hull, Canada
R.D. Sriram, NIST, USA
Dr. Ramana Reddy, CERC, West Virginia University, USA
CERA Journal ASSISTANT EDITOR
Christopher Rush
Cranfield University, School of Industrial
Manufacturing Science, Department of Enterprise Integration,
Cranfield, UK
EDITORIAL REVIEW BOARD
Chimay Anumba, Loughborough University, UK
D. R. Bahler, NC State University, USA
P. Bernus, Griffith University, Australia
D. Brown, Worcester Polytechnic Institute, USA
B. Chaib-draa, Universite Laval, Canada
S. Chandrashekhar, Lucent Technologies, USA, USA
L. Charny, Boston University, USAP.
K. Chawdhry, University of Bath,
Z. Dong, University of Victoria, Canada
S. Ganesan, Oakland University, USA
E. Gentili, University of Brescia, Italy
P. Ghodous, Univ. of Lyon, France
R. Gill, Middlesex University, U.K.
P. Gu, University of Saskatchewan, Canada
A. Gunasekaran, University of Massachusetts,
Dartmouth, USA.
Kas Kasravi, Electronic Data Systems, MI, USA
Mark Klein, Massachusetts Institute of Technology, USA
J. Kreiner, Cal State Univ, Fullerton, USA
S. Manoochehri, Stevens Int. of Tech., NJ, USA
K. Pawar, Univ. of Nottingham, UK
R. M. Rangan, Product Sight Corp., USA
J. R. Rinderie, University of Massachusetts, USA
R. Roy, Cranfield University, Bedford, UK
D. Serrano, Univ. of Puerto Rico, Puerto Rico
M. Sobolewski, General Electric, USA
S. Stifter, Johannes Kepler University, Austria
K. P. Sycara, Carnegie Mellon University, USA
V.E. Theodoractos, GM, USA
J. M. Usher, Mississippi State University, USA
J. S. M. Vergeest, Delft Univ. of Tech., The
Netherlands
Nel Wognum, University of Twonte, The Netherlands |
